AUG 14: The CSIR–National Physical Laboratory (CSIR-NPL), New Delhi, organised the two-day National Conference MAPIKI 2025 on 11–12 August 2025, themed “Measurements for All Times, for All People.” The event aimed to unite stakeholders from across the metrology sector to discuss developments, innovations, and challenges in strengthening India’s metrological traceability chain, contributing to the nation’s economic and social progress.
The conference opened with the release of a flyer detailing the Calibration and Testing activities of the Physico-Mechanical Metrology Division of CSIR-NPL. The Chief Guest was Dr. Nagahanumaiah, Director, Central Manufacturing Technology Institute (CMTI), Bengaluru, and the Guest of Honour was Dr. S.D. Attri, Member (Technical), Commission for Air Quality Management in NCR and adjoining areas.
Around 150 participants, including scientists, technical officers, research associates, and Ph.D. scholars, attended the conference and delivered lectures on diverse metrology topics. A poster session featured 44 research posters, with active participation from young researchers. The best posters were recognised with awards for their innovation and contribution.
A notable highlight of MAPIKI 2025 was the transfer of CSIR-NPL technology titled “Recycling Metal/Polymer Laminate-based MLPs for Recovery of Materials for Technological Applications” to industry partners, reflecting the lab’s commitment to sustainable innovation and industrial collaboration.
In his valedictory address, Prof. Venugopal Achanta, Director, CSIR-NPL, underscored the importance of metrology in socio-economic development and its central role in establishing national measurement standards. He encouraged CSIR-NPL scientists to advance indigenous measurement solutions, which he described as critical to India’s technological self-reliance and global competitiveness.
The conference reinforced the significance of precision measurements in diverse sectors, from manufacturing to environmental monitoring, while providing a collaborative platform for knowledge exchange, capacity building, and fostering innovation in the metrology domain.
